A holistic fast and parallel approach for accurate transient simulations of analog circuits

Journal of Mathematics in Industry

Table 1 List of the nine test circuits that were taken from a wide range of applications (e.g., ADCs, mixers, PLLs) and semiconductor technologies

Name	# semicond.	# MOSFET	# R	# C	# MNA	# NNZ
cir1	35,671	35,621	1160	1633	20,826	173,347
cir2	20,057	20,057	395	2820	9837	92,921
cir3	10,979	10,919	599	34,010	6559	90,859
cir4	713	613	11,585	26,533	10,492	93,762
cir5	31,185	31,075	4884	205,219	80,706	885,501
cir6	239,034	217,034	4806	13,348	145,903	1,158,732
cir7	319,395	318,395	4072	43,837	170,524	1,498,263
cir8	109,379	109,279	5563	745,088	270,044	3,129,289
cir9	55,601	55,491	319,110	2,228,295	432,009	5,991,033

For each circuit we list in the second column the total number of semiconductors (MOSFETs, BJTs, JFETs, diodes) and in the next column only the number of MOSFETs. In the following columns we enlist the number of resistors and capacitors which are the dominant part for extracted circuits. In the last two columns we list the total number of MNA variables in the DAE system and the number of nonzero entries in the resulting system matrix.