Skip to main content

Table 7 Memory cell: reference probability estimation

From: Hybrid importance sampling Monte Carlo approach for yield estimation in circuit design

Method Probability (\(\hat{\mathrm{p}}_{\mathrm{fail}}^{\mathrm {ref}}\)) Variance (\(\widehat{\sigma }_{\mathrm {ref}}^{2}\)) CV (%) #Runs
ISMC 6.01 × 10−8 9.26 × 10−20 0.99 315,000