Skip to main content

Table 7 Memory cell: reference probability estimation

From: Hybrid importance sampling Monte Carlo approach for yield estimation in circuit design

Method

Probability (\(\hat{\mathrm{p}}_{\mathrm{fail}}^{\mathrm {ref}}\))

Variance (\(\widehat{\sigma }_{\mathrm {ref}}^{2}\))

CV (%)

#Runs

ISMC

6.01 × 10−8

9.26 × 10−20

0.99

315,000