From: Hybrid importance sampling Monte Carlo approach for yield estimation in circuit design
Method | Probability (\(\hat{\mathrm{p}}_{\mathrm{fail}}^{\mathrm {ref}}\)) | Variance (\(\widehat{\sigma }_{\mathrm {ref}}^{2}\)) | CV (%) | #Runs |
---|---|---|---|---|
ISMC | 6.01 × 10−8 | 9.26 × 10−20 | 0.99 | 315,000 |